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Biomaterials & Bioengineering |
Silica Nanoparticles to Polish Tooth Surfaces for Caries Prevention
R.M. Gaikwad1 and
I. Sokolov1,2,3,4,*
1 Department of Physics, Clarkson University, 8 Clarkson Ave., Potsdam, NY 13699, USA;
2 NanoBio Laboratory (NABLAB),
3 Dept. of Chemistry and Biomolecular Science, and
4 NY Center for Material Processing (CAMP), Clarkson University, Potsdam, NY 13699, USA
Correspondence: * corresponding author, isokolov{at}clarkson.edu
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ABSTRACT
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Although silica particles have been used for tooth polishing, polishing with nanosized particles has not been reported. Here we hypothesize that such polishing may protect tooth surfaces against the damage caused by cariogenic bacteria, because the bacteria can be easily removed from such polished surfaces. This was tested on human teeth ex vivo. The roughness of the polished surfaces was measured with atomic force microscopy (AFM). A considerably lower nanometer-scale roughness was obtained when silica nanoparticles were used to polish the tooth surfaces, as compared with conventional polishing pastes. Bacterial attachment to the dental surfaces was studied for Streptococcus mutans, the most abundant cariogenic bacteria. We demonstrated that it is easier to remove bacteria from areas polished with silica nanoparticles. The results demonstrate the advantage of using silica nanoparticles as abrasives for tooth polishing.
Key Words: silica nanoparticles polishing enamel carious Streptococcus mutans atomic force microscopy
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INTRODUCTION
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Tooth enamel is damaged gradually during the human lifetime, depending on a persons dietary habits. Some cariogenic bacteria living in human mouths can survive on tooth surfaces and form colonies (Loesche, 1986). The acid produced by these bacteria causes enamel to demineralize, and, consequently, causes caries. The polishing of dental surfaces is a well-known practice in dentistry (Roulet and Roulet-Mehrens, 1982; Christensen, 1990; Gurgan et al., 1997; Berry et al., 1999; Banerjee et al., 2000). This is used to make it difficult for plaque and cariogenic bacteria to accumulate on tooth surfaces. Thus, polishing is a preventive procedure used as a primary defense against dental problems. Micron-sized silica particles are a typical component of conventional polishing pastes. In the first-order approximation, one could expect that the smaller the abrasive particles, the smoother the polished surface. An example of such an approach is known as the chemical-mechanical planarization process (Berdyyeva et al., 2003; Lu et al., 2005), used in the semiconductor industry. The chemical-mechanical planarization technique uses various nanometer-sized particles to polish surfaces of semi-conductor wafers to a sub-nanometer level. However, attaining such a smooth surface requires considerable research and optimization. Thus, it is debatable whether a noticeable improvement in the roughness of tooth enamel can be achieved with the use of nanosized abrasives. Second, what level is beneficial to decrease the roughness of tooth surfaces? Bacterial attachment is biochemical in nature. It might be simply insensitive to a change in roughness at the nanometer level.
In the present study, the primary technique of choice was Atomic Force Microscopy (AFM). Previously, AFM has been successfully used for the study of dental surfaces (Schaad et al., 1993; El Feninat et al., 1998; Yoshida et al., 1999; Rodriguez et al., 2006; Gruverman et al., 2007) as well as bacteria and eukaryotic cells (Sokolov et al., 1996, 2001, 2007; Berdyyeva et al., 2005; Sokolov, 2006). Here we used it not only to investigate the roughness of tooth surfaces, but also to study the ease of bacterial removal from tooth enamel.
Our first hypothesis, based on the approach used in chemical-mechanical planarization, was that the tooth surface could be made smooth if we polished it with nanosized abrasives. Silica particles were the material of choice because of their biocompatibility and low cost. Our second hypothesis was that the roughness we attained by polishing with nanoparticles would play a visible role in the removal of bacteria from the tooth surface. In general, the forces of interaction of an organic substance with flat surfaces are comparatively weaker than with rough corrugated surfaces, because of the increased area of the rough surface compared with the flat one. In the case of bacterial attachment, it may not necessarily be that simple. For example, bacteria could still attach strongly even to a rather smooth surface, so the difference in adhesion could be negligible when we consider the change of roughness at the nanoscale level.
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MATERIALS & METHODS
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Tooth Samples
The tooth samples used for the research were deciduous exfoliated human teeth (the donors identities were kept anonymous by the institutional review board, and the study was approved for exemption). The surfaces were not treated with any chemicals before study. Each tooth was cut into 4 pieces by means of a cutter (Indigo, Inc., Waterloo, ON, Canada), and each piece was attached to a glass slide with water-insoluble glue (Loctite E-30CL Hysol® Epoxy Adhesive, Ellsworth Adhesives, Germantown, WI, USA) with the enamel exposed face-up for polishing. The glue was allowed to cure overnight.
Bacterial Culture
Streptococcus mutans (Wards Lyophilized Bacteria 85-1957, Ward System Group, Inc., Frederick, MD, USA) was received freeze-dried. It was regenerated by being dissolved in 5 mL of culture medium (tryptic soy broth). The solution was then kept overnight in a water bath maintained at 37°C. The bacterial solution (bacteria and culture medium) was centrifuged for about 5 min at 20,000 g. The supernatant was discarded carefully to retain the pellet of bacteria at the bottom of the tube. The pellet was then re-suspended in 3 mL of de-ionized water to wash away the culture medium and acid produced by the bacteria. Sodium acetate buffer was used to maintain the pH 5.0 of the medium, which was kept at 37°C. The bacteria were again centrifuged, and the pellet was re-suspended in a pH 5.0 solution of 15% glucose and sodium acetate. This bacterial solution was applied to tooth surfaces to form biofilms. It should be noted that we did not add saliva to the medium, to avoid complexity of its intrinsic variability. Salivary pellicle forms via the adsorbance of different polysaccharides and protein molecules onto dental surfaces. Thus, it forms a continuous layer. The energy required for the removal of such a layer is directly proportional to the area of the tooth surface, which, in turn, is proportional to the roughness. Therefore, we expected that the effect of saliva would not change the results found here for bacterial adhesion (the rougher the surface, the more difficult the bacterial removal).
To allow the bacterial films to grow on the tooth surfaces, the tooth samples were immersed overnight in the bacterial suspension, as described above, in a water bath (Model #406015, American Optical, Buffalo, NY, USA) at 37°C. The sample was rinsed from the sides with de-ionized water to remove excess bacterial colonies.
Atomic Force Microscopy (AFM)
AFM is a technique based on the detection of forces acting between a sharp tip, the AFM probe, and sample surface, for example, a tooth surface (Binnig et al., 1986). A schematic of the AFM set-up is shown in Fig. 1 of the APPENDIX. In this study, we used a NanoscopeTM Dimension 3100 AFM (Veeco/DI Instruments, Inc., Santa Barbara, CA, USA), operating in liquid. The roughness calculations were done with the built-in AFM software (version 5.12r4). All scanning measurements were performed on the tooth surface immersed in de-ionized water. V-shaped standard wide 200-µm AFM cantilevers (Veeco, Santa Barbara, CA, USA) were used throughout the study. The imaging was performed in the contact mode. A scanning speed of 3 Hz was used for imaging in contact mode, while a scanning speed of 15 Hz was used for the raster mode, which was used to monitor removal of the bacteria. During raster scanning, the scanning angle was set at 90 degrees, to provide the homogeneous lateral force (friction force) responsible for bacteria removal.
In this work, we used AFM as both a microscope and a soft brush (the rastering AFM tip) to remove bacteria from the tooth surface while imaging the tooth surface in contact mode. This technique is analogous to the action of a single fiber of a soft cleaning brush. The AFM probe scans rather quickly over the tooth surface and moves with constant load force, which helps to monitor removal of the bacteria in a highly controlled manner.
Nanoparticle Slurry for Polishing
The abrasive slurry used was prepared from 5 wt% spherical colloidal silica particles stabilized in aqueous ammonia solution. The particle diameters were in the range of 60 ± 4 nm, as estimated by means of a Bruker particle-size analyzer (Bruker Corp., Billerica, MA, USA). The particles were used directly from a commercial slurry (Klebesol 1300, Hoechst, Bridgewater, NJ, USA). To make the solution suitable for human tooth polishing, we adjusted it to neutral pH by neutralization with acetic acid (Fisher Scientific, Inc., Pittsburgh, PA, USA).
Polishing Procedure
The polishing was done by means of a polyurethane pad (IC1400, Rodel, Inc., Phoenix, AZ, USA) attached to a polishing machine (GP-10, Grinder and Polisher, LECO Corporation, St. Joseph, MI, USA). A load of 5 gm was attached to the top of one end of a glass slide where the tooth was glued (Fig. 1 ). The other side of the glass slide was gently held by fingers. A constant flow of the slurry of nanoparticles was maintained. After about 20 sec of polishing, the tooth was viewed by optical microscopy to estimate the degree of polishing. A similar procedure, but with longer polishing times of about 2 min, was used for a commercially available CrestTM cavity protection regular paste (Procter & Gamble, Inc., Cincinnati, OH, USA), and 1 min for a specialized polishing paste, NuPro Prophylaxis PasteTM with fluoride (hereafter referred to as "NuProTM") (fine grit, Dentsply Caulk, Milford, DE, USA), used by dentists for cleaning tooth enamel. The longer times in the latter case were used to attain approximately the same amount of enamel removal during polishing as was qualitatively estimated by optical microscopy (see APPENDIX, Fig. 2). For imaging the tooth surface under AFM, the tooth sample was de-bonded from the glass slide after being polished and placed in a Petri dish with water-insoluble glue for adhesion (Loctite E-30CL Hysol® Epoxy Adhesive).
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RESULTS
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Roughness of the Polished Surfaces
First, we estimated the degree of polishing by regular optical microscopy. Optical images of 4 dental surfaces—virgin, polished with CrestTM, NuProTM, and nanosilica slurry—are shown in the APPENDIX (Fig. 2 ). AFM measurements were performed on the areas identified as polished with optical microscopy. Representative 15 x 15 µm2 AFM images of the 4 corresponding surfaces (virgin, polished with CrestTM, NuProTM, and nanosilica slurry) are shown (Fig. 2 ).

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Figure 2. AFM images (15 x 15 µm2) of (a) virgin, (b) toothpaste-polished (CrestTM), and (c) dental toothpaste-polished (NuProTM) surfaces. (d) Slurry-polished tooth. Scale bars are 3 microns.
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Quantitative analysis of roughness was undertaken for the areas of 5 x 5 µm2. This was justified by the size of S. mutans bacteria. We assumed that the roughness should be analyzed over the area comparable with the bacterium size to contribute bacterial adhesion. This is plausible because it is unlikely that a bacterium would develop adhesion to an area much larger than its size. Statistical distributions for the roughness obtained are as shown (Fig. 3 ). The average roughness and standard deviation (with respect to the normal distribution) of the distributions are as follows: 21 ± 6 nm (virgin tooth), 22 ± 4 nm (CrestTM-polished), 25 ± 5 nm (NuProTM-polished), and 2.4 ± 1.4 nm (polished with the nanoparticle slurry). While the difference among the first 3 roughnesses is statistically insignificant, one can see a decrease by an order of magnitude for the surfaces polished with the nanoparticle slurry.

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Figure 3. Roughness distribution for (a) Virgin tooth, (b) CrestTM toothpaste-polished, (c) NuProTM-polished, and (d) slurry-polished tooth surface. The average and standard deviation values are: 21 ± 6 nm (a), 22 ± 4 nm (b), 25 ± 5 nm (c), and 2.4 ± 1.4 nm (d).
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Bacterial Removal from the Surfaces with Different Roughnesses: AFM Study
To correlate the removal of S. mutans bacteria from the tooth surface and the surface roughness, we used the raster AFM scanning method. To get a sufficient variation in roughnesses, we studied the bacterial removal on a tooth surface that was just slightly polished with nanoparticles (some areas having a roughness corresponding to that of the completely polished surface, as described previously). A series of AFM images of the slurry-polished tooth surface, with adherent S. mutans, was captured after a certain number of raster scans (Fig. 4 ). After the first scans, weakly attached bacteria were removed by the lateral force of the AFM probe (Fig. 4a ). After several scans, more tightly attached bacteria were also removed (Fig. 4b ). Finally, the bacteria with strongest adhesion were removed (Fig. 4c ). This mimics the action of a single fiber of a soft cleaning brush. The total scanning time to collect those images was about 2 min, completing approximately a dozen full scans.

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Figure 4. A series of AFM images (a–c) of a slurry-polished tooth surface with adherent S. mutans. Image (a) was taken after initial scans; (b) shows the bacterial adhesion after approximately 1 min; (c) demonstrates the bacteria remaining at the end of the scanning series. A schematic of the rastering mode is also shown (d). During the rastering, the AFM probe moves quickly from left to right, while slowly scanning up and down. The bacteria attached to the surface can be removed by the lateral force of the AFM probe. (a) Relatively small area of the tooth surface, which was initially covered with a continuous layer of bacteria, and was just exposed after the initial bacterial removal. (b) Shows the bacteria survived after approximately 1 min. (c) Demonstrates the remaining bacteria at the end of a two-minute scan series. White asterisks (boxes) indicate areas with roughness of 1.8–2.4 nm (5.0–5.5 nm). During scanning, the bacteria were removed from the lower-roughness areas (marked with asterisks) first, and from higherroughness areas (marked with boxes) last. Scale bars are 4 microns.
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Calculating the roughness on the tooth surface, we found that the roughness of the areas in which the bacteria were removed after the first scans (Fig. 4c , asterisks) ranged within 1.8 to 2.4 nm. In contrast, the areas in which bacteria were removed only after the complete series of scans (Fig. 4c , squares) had a roughness of 5.0 to 5.5 nm. In other words, bacteria were initially removed from smoother areas (roughness, 1.8–2.4 nm; Fig. 4a ) and remained longer on the rougher ones (roughness, 5.0–5.5 nm; Figs. 4b, 4c ). We obtained the same correlation in macroscale using soft brushes to clean away bacterial films (APPENDIX Fig. 3).
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DISCUSSION
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We compared tooth roughnesses for virgin, toothpaste-polished (regular CrestTM and NuProTM), and nanoparticleslurry- polished teeth. CrestTM toothpaste is not intended for polishing, so we expected to see no noticeable change in roughness after polishing with CrestTM toothpaste. NuProTM is a professional prophylactic toothpaste used for light polishing. The abrasives used in the NuProTM paste range from 1 to 180 µm (as estimated by optical microscopy). During polishing, however, these abrasives can be broken into smaller particles. Nevertheless, our roughness calculations showed no statistical difference in roughness (calculated for the micron scale area) after polishing with either of the pastes. Comparing this result with the macroscopic images of the polished surfaces, one can conclude that polishing with NuProTM does not improve surface smoothness at the micron scale, while resulting in noticeable removal of enamel at the macro (multi-micron) scale. Polishing with CrestTM toothpaste results in almost no enamel removal, at either the micro or macro scale. These results are not surprising, since neither toothpaste is intended to provide polishing at the micron scale. We showed that the use of silica nanoparticles for polishing of tooth surfaces allowed us to attain single-nanometer values of roughness, an order of magnitude better than the roughness of the surfaces polished with the professional fine polishing paste NuProTM.
Analyzing the results in terms of bacterial removal, one can clearly see that S. mutans bacteria can be removed more easily from the smoother surfaces polished with silica nanoparticles than from the rougher ones. This can be helpful in protecting teeth against the damage caused by cariogenic bacteria. These results can be used in the formulation of new dental polishing pastes.
The results presented here demonstrate an advantage of using silica nanosized particles as abrasives for the polishing of dental surfaces. There are obviously numerous unanswered questions, first among which is how long the effect of polishing will last, and whether the polished surface will inhibit mineralization and plaque formation. These and other questions will be addressed in future research.
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ACKNOWLEDGMENTS
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Support from NanoBio Laboratory (NABLAB), Clarkson University, is acknowledged by IS.
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FOOTNOTES
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A supplemental appendix to this article is published electronically only at http://jdr.iadrjournals.org/cgi/content/full/87/10/980/DC1.
Received for publication January 22, 2008.
Revision received June 18, 2008.
Accepted for publication June 27, 2008.
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Journal of Dental Research, Vol. 87, No. 10,
980-983 (2008)
DOI: 10.1177/154405910808701007

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