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Figure 6. TEM micrographs of crystalline aggregates formed in the presence of monomeric rM179 (A), monomeric rM166 (B), and pre-assembled rM179 (C), and their corresponding electron diffraction patterns (inserts). (Reprinted [with modification] from Beniash et al., 2005, with permission from Elsevier.)

J DENT RES, Vol. 85, No. 9, 775-793 (2006)
DOI: 10.1177/154405910608500902

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