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Figure 3. Morphology and elemental composition of retrieved bone-implant interface. Scanning electron microscopic (SEM) images of the week-2- and -4-retrieved machined implant surfaces (A,C) and acid-etched implant surfaces (B,D). Magnified images (E-J) were obtained from the circled areas of e-j in panels A-D, respectively. Bar = 1 mm for panels A-D, 100 µm for panels E-J. (K-P) Energy-dispersive spectroscopic (EDX) elemental analysis of the retrieved implant surfaces for Ti, Ca, P, and S elements. The spectra K, L, and M were obtained from the images E, F, and I, respectively, and the spectra N, O, and P were from the images G, H, and J.
J DENT RES, Vol. 85, No. 6,
560-565 (2006)
DOI: 10.1177/154405910608500616
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