This Article Abstract Full Text Full Text (PDF) Alert me when this article is cited Alert me if a correction is posted Services Email this article to a friend Similar articles in this journal Similar articles in PubMed Alert me to new issues of the journal Add to Saved Citations Download to citation manager Request Permissions Request Reprints Add to My Marked Citations Citing Articles Citing Articles via Google Scholar Citing Articles via Scopus Google Scholar Articles by Yoshida, Y. Articles by Van Meerbeek, B. Search for Related Content PubMed PubMed Citation Articles by Yoshida, Y. Articles by Van Meerbeek, B. Pubmed/NCBI databases Compound via MeSH Substance via MeSH Hazardous Substances DB SILICON DIOXIDE Social Bookmarking                         What's this?

Improved Filler-Matrix Coupling in Resin Composites

¹ Department of Biomaterials, Okayama University Graduate Schools of Medicine and Dentistry, 2-5-1 Shikata-cho, Okayama 700-8525, Japan;
² Department of Operative Dentistry, Hiroshima University Faculty of Dentistry, 1-2-3 Kasumi, Minami-Ku, Hiroshima 734-8553, Japan;
³ Surface Science Laboratory, Toray Research Centre Inc., Sonoyama 3-3-7, Otsu, Shiga 520-8567, Japan;
⁴ Department of Biomaterials Science, Hiroshima University Faculty of Dentistry, 1-2-3 Kasumi, Minami-Ku, Hiroshima 734-8553, Japan;
⁵ Department of Oral Health Science, Hokkaido University Graduate School of Dental Medicine, Kita 13 Nishi 7, Kita-ku, Sapporo 060-8586, Japan; and
⁶ Leuven BIOMAT Research Cluster-Department of Conservative Dentistry, School of Dentistry, Oral Pathology and Maxillo-Facial Surgery, Catholic University of Leuven, Kapucijnenvoer 7, B-3000, Leuven, Belgium;

View larger version (14K): [in this window] [in a new window]   Figure 1. XPS wide-scan spectra of un-decontaminated SiO2 in (a), SiO2 boiled in 0.01 (b), 0.05 (c), 5 (d), and 10% (e) sodium peroxodisulfate solutions for 15 min, followed by ultrasonic rinsing with acetone for 30 min.

View larger version (16K): [in this window] [in a new window]   Figure 2. XPS wide-scan spectra of SiO2 decontaminated with 5% sodium peroxodisulfate solution and acetone, then treated with -MPTS, followed by ultrasonic rinsing twice in ultrapure water for 5 min in (a), SiO2 decontaminated with 5% sodium peroxodisulfate solution and acetone, then treated with TTDCS, followed by ultrasonic rinsing twice in chloroform for 5 min in (b), and SiO2 treated with TTDCS without pre-silanization decontamination in (c).

View larger version (15K): [in this window] [in a new window]   Figure 3. XPS wide-scan spectrum of untreated Si in (a), Si decontaminated with 5% sodium peroxodisulfate solution and acetone in (b), Si decontaminated with 5% sodium peroxodisulfate solution and acetone, then dipped in a 10% hydrofluoric acid solution to remove the oxidation layer, followed by rinsing with ultrapure water in (c), contamination-free bare Si treated with -MPTS in (d), and contamination-free bare Si treated with TTDCS in (e).

View larger version (47K): [in this window] [in a new window]   Figure 4. Schematic presentation of the chemical interaction between TTDCS and Si in (a), TTDCS and SiO2 in (b), -MPTS and Si in (c), and –MPTS and SiO2 in (d), respectively.

Journal of Dental Research, Vol. 81, No. 4, 270-273 (2002)
DOI: 10.1177/154405910208100409


CiteULike    Complore    Connotea    Del.icio.us    Digg    Reddit    Technorati    Twitter    What's this?