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Journal of Dental Research
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Biomaterials & Bioengineering

Four-year Water Degradation of Total-etch Adhesives Bonded to Dentin

J. De Munck1, B. Van Meerbeek1,*, Y. Yoshida2, S. Inoue3, M. Vargas4, K. Suzuki2, P. Lambrechts1 and G. Vanherle1

1 Leuven BIOMAT Research Cluster, Department of Conservative Dentistry, School of Dentistry, Oral Pathology and Maxillo-Facial Surgery, Catholic University of Leuven, Kapucijnenvoer 7, B-3000 Leuven, Belgium;
2 Department of Biomaterials, Okayama University Graduate School of Medicine and Dentistry, 2-5-1 Shikata-cho, Okayama 700-8525, Japan;
3 Department of Oral Health Science, Hokkaido University Graduate School of Dental Medicine, Kita 13 Nishi 7, Kita-ku, Sapporo 060-8586, Japan; and
4 Department of Operative Dentistry, The University of Iowa, Iowa City, USA;

Correspondence: *corresponding author, bart.vanmeerbeek{at}med.kuleuven.ac.be

Resin-dentin bonds degrade over time. The objective of this study was to evaluate the influence of variables like hybridization effectiveness and diffusion/elution of interface components on degradation. Hypotheses tested were: (1) There is no difference in degradation over time between two- and three-step total-etch adhesives; and (2) a composite-enamel bond protects the adjacent composite-dentin bond against degradation. The micro-tensile bond strength (µTBS) to dentin of 2 three-step total-etch adhesives was compared with that of 2 two-step total-etch adhesives after 4 years of storage in water. Quantitative and qualitative failure analyses were conducted correlating Fe-SEM and TEM. Indirect exposure to water did not significantly reduce the µTBS of any adhesive, while direct exposure resulted in a significantly reduced µTBS of both two-step adhesives. It is concluded that resin bonded to enamel protected the resin-dentin bond against degradation, while direct exposure to water for 4 years affected bonds produced by two-step total-etch adhesives.

Key Words: adhesion • dentin • total-etch • bond strength • durability

Journal of Dental Research, Vol. 82, No. 2, 136-140 (2003)
DOI: 10.1177/154405910308200212
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