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Journal of Dental Research
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An X-ray Spectrometric Technique for Measuring Porcelain-Metal Adherence

R.D. Ringle

Section of Dental Materials, Department of Restorative Dentistry, Medical College of Georgia, School of Dentistry, Augusta, Georgia 30912

J.R. Mackert, Jr

Section of Dental Materials, Department of Restorative Dentistry, Medical College of Georgia, School of Dentistry, Augusta, Georgia 30912

C.W. Fairhurst

Section of Dental Materials, Department of Restorative Dentistry, Medical College of Georgia, School of Dentistry, Augusta, Georgia 30912

This study demonstrated a correlation between silicon x-ray counts and area fractions of adherent porcelain as determined by point-counting. This correlation has allowed a method to be devised for measuring area fractions of porcelain adherent to porcelain-fused-to-metal (PFM) fracture surfaces. The described method, after controlled destruction of the porcelain mass, uses silicon x-rays excited by the electron beam in a scanning electron microscope. Under the conditions employed in these studies, the x-ray technique has shown that this gold alloy retains more porcelain than does either of two particular nickel-chromium alloys.

Journal of Dental Research, Vol. 62, No. 8, 933-936 (1983)
DOI: 10.1177/00220345830620081801
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