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Stress Analysis of Porous Rooted Dental Implants
Allan M. Weinstein
Clemson University, Clemson, South Carolina 29631, USA
Jerome J. Klawitter
Clemson University, Clemson, South Carolina 29631, USA
Subhash C. Anand
Clemson University, Clemson, South Carolina 29631, USA
Richard Schuessler
Clemson University, Clemson, South Carolina 29631, USA
A two-dimensional plane stress finite element analysis of porous rooted dental implants was performed. The results of this analysis were compared to results obtained from mechanical tests performed on actual implanted specimens. The appropriate selection of interface material properties was shown to be highly significant.
Journal of Dental Research, Vol. 55, No. 5,
772-777 (1976)
DOI: 10.1177/00220345760550051001

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