Figure 1. Surface morphology images of titanium disks used for cell culture. Scanning electron microscopic (SEM) images of the (A) polystyrene, (B) machined titanium surface, and (C) dual-acid-etched (DAE) titanium surface. Bar = 5 µm. Atomic force microscopic (AFM) images of the (D) polystyrene, (E) machined titanium, and (F) the DAE titanium. All AFM images were scanned in a 5 µm x 5 µm area, and images were constructed in a custom vertical scale; 15.64 nm for panel D, 146.49 nm for panel E, and 816.50 nm for panel F.